A section of the participants following the presentations.
The Department of Physics in the School of Natural Sciences, conducted a three-day virtual workshop from 18 to 20 July 2023 in collaboration with the Materials Research Society of Kenya (MRS-K), with the aim of training natural scientists on how to use an X-ray diffractometer equipment, that is vital for the characterization of materials for research in natural sciences. The event was graced by the Deputy Vice-Chancellor (Academic and Students Affairs), Prof. Hussein Golicha.
Prof. Golicha acknowledged the importance of science as a driving force behind innovation, progress, and our understanding of the world around us. He encouraged the participants to embrace the spirit of curiosity and open-mindedness for science since it is all about questioning the unknown, challenging existing theories, and pushing the boundaries of our knowledge.
"Science empowers us to ask questions, seek answers, and make breakthroughs that shape our future, we have gathered here to dive deep into the fascinating world of crystallography. We have an incredible lineup of activities which include lectures, practicals, and discussions that will engage your minds and ignite your passion for crystallography," said Prof. Golicha.
Representing the Dean, Dr. Bernard Rapando, affirmed that MMUST having the X-ray diffractometer is an achievement, through this training, we will be able to acquire knowledge and gain more experience as natural scientists in carrying out quality analysis in our environment, hence achieving our goals in research. The aim is to support research within the institution and globally. Having been instilled with the necessary training in using the X-ray diffractometer, we will be able to offer the full-service capability for powder diffraction, as well as a training program for students and academics to gain the necessary skills to be able to use the XRD instrumentation and interpret the collected data.
The Chairperson of the Department- Physics, Dr. Maxwell Mageto applauded the team from the Cambridge Crystallographic Data Centre (CCDC) from the United Kingdom, International Centre for Diffraction Data (ICDD) from the USA, the University of Lorraine, France, and the University of KwaZulu-Natal, South Africa, for sharing their knowledge on the XRD equipment and commitment to the workshop. He has hopes for more collaboration in the future. “These networks will expand our knowledge in different perspectives; it will not only educate all the natural scientists but also help to bridge the gap of quality analysis in the natural science environment”, he said.
The Chairperson of Department- Physics, Dr. Maxwell Mageto during the conference.
The organizer of the workshop- Dr. Victor Odari, who is a lecturer in the Department of Physics MMUST, was pleased that the workshop had aided them in achieving their goal which was to bring all scientists in Kenya and beyond for training on the usage of the X-ray diffractometer; this was achieved through lectures on production of x-rays to calibration of the equipment for quality data acquisition, data mining and phase identification of materials using the ICDD crystallographic database, to the remote lab operation of the equipment at the University of Lorraine, France. He hinted at having more similar or better workshops in the near future at MMUST.
The workshop was graced by The Chairman of The Materials Research Society of Kenya - Prof. George Amolo, The C.E.O National Research Fund, Kenya - Prof. Dickson Andala, The President of Africa Crystallographic Association (AfCA) – Prof. Delia Haynes, The Executive Outreach Officer of International Union of Crystallography (IUCr) - Prof. Michele Zema, The Executive Director of International Centre for Diffraction Data (ICDD) - Prof. Thomas Blanton and Prof. Bendeif El-Eulmi from Crystallography, Magnetic Resonance and Modeling Laboratory of University of Lorraine, France.
The participants of the event were drawn from over 30 universities in Africa, industries, and government agencies. Some of the countries represented were: Kenya, Nigeria, South Africa, Cameroon, Senegal, Guinea, Uganda, Tanzania, Poland, and Malaysia.
The participants shared their knowledge and expertise through various lectures and hands-on exercises, including: ‘Production and properties of X-rays’, ‘Production of monochromatic X-radiation’, Components of the diffraction pattern, the powder diffractometer, Acquisition of good diffraction data, Qualitative phase identification, Industrial applications of X-ray powder diffraction, Hands-on use of computers for demonstration of the latest software, factors affecting the accuracy of measured 2theta values, Factors affecting intensities of diffraction peaks, Use of computer methods for data reduction and qualitative phase identification. Quantitative analysis: specimen preparation considerations, Reference Intensity Ratios, absorption correction methods, matrix-flushing methods, and whole-pattern analysis using the Rietveld method Structure solution and refinement using the Rietveld method, Application of PXRD, Computer Software for Visualization, Analysis of XRD Structures and Remote lab demonstration on running a Single Crystal XRD measurement.
By Ivy Alivitsa and Milicent Masitsa
